CSA Group Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices (Adopted ISO/IEC 10373-3:2018, third edition, 2018-09)

CSA Preface Standards development within the Information Technology sector is harmonized with international standards development. Through the CSA Technical Committee on Information Technology (TCIT), Canadians serve as the SCC Mirror Committee (SMC) on ISO/IEC Joint Technical Committee 1 on Information Technology (ISO/IEC JTC1) for the Standards Council of Canada (SCC), the ISO member body for Canada and sponsor of the Canadian National Committee of the IEC. Also, as a member of the International Telecommunication Union (ITU), Canada participates in the International Telegraph and Telephone Consultative Committee (ITU-T). This Standard has been formally approved, without modification, by the Technical Committee and has been developed in compliance with Standards Council of Canada requirements for National Standards of Canada. It has been published as a National Standard of Canada by CSA Group. Scope This document defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816-3. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 that defines the information storage technologies employed in identification card applications. NOTE Criteria for acceptability do not form part of this document but can be found in the International Standards mentioned above. This document defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts of the ISO/IEC 10373 series define other technology‑specific tests. Test methods defined in this document are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in this document are based on ISO/IEC 7816-3. Conformance of cards and IFDs determined using the test methods defined in this document does not preclude failures in the field. Reliability testing is outside the scope of this document. This document does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. The minimum functionality is defined as follows. — Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard. — Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.